D-Algorithm The D-Algorithm is a systematic approach for generating test patterns for VLSI circuits. It involves a series of transformations on the circuit'...
D-Algorithm
The D-Algorithm is a systematic approach for generating test patterns for VLSI circuits. It involves a series of transformations on the circuit's netlist, including structural, logic, and behavioral transformations. By applying these transformations, the D-Algorithm generates test patterns that cover a wide range of potential defects and variations.
PODEM
PODEM (Partial Ordered Differential Extraction of Multiple Defects) is an algorithm used in the verification of VLSI circuits. It involves repeatedly extracting a subset of defects from the original netlist and testing them individually. The results from these tests are then used to infer the original circuit netlist. PODEM is a powerful technique for identifying design defects that may be difficult to detect using traditional test methods.
FAN
A Fault-Aware Netlist (FAN) is a netlist that includes additional logic to track and record fault effects in the original circuit. FANs can be used to generate test patterns that cover a wider range of defects than traditional test patterns. This allows for the identification of latent defects that may not be detected by simpler test methods